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Beilstein J. Nanotechnol. 2015, 6, 215–222, doi:10.3762/bjnano.6.20
Figure 1: SEM image of a typical example of an as-deposited CNF onto the tip apex of the Si AFM probe.
Figure 2: Results of LAO-AFM on Si with CNF (a) and Si (b) probes as a function of the writing speed (μm/s). ...
Figure 3: Results of LAO-AFM on Si with CNF (a) and Si (b) probes as a function of the bias voltage (in V). W...
Figure 4: Monitoring chemical and mechanical stability of CNF probes for LAO-AFM. SEM images before (a) and a...
Figure 5: Reproducibility for patterning line arrays by using CNF probes. Array of lines written at a) 23.4 V...
Figure 6: Kinetics of LAO-AFM on Si by using CNF versus Si probes. a) Line height upon writing speed for a bi...